Choose the right system

cleanlinessimg03What’s new?

The Leica Cleanliness Expert is now available for various customer needs and microscope systems.

 

Leica DM4000 M LED or Leica DM6000 M

Customers need:
•Measurement of particle length and breadth down to 5 μm
•Measurement of particle height
•No user influence (ensured through coded and motorized microscope)
•Fully reproducible settings

 

Leica DM2700 M

Customers need:
•Measurement of particle length and breadth down to 5 μm
•Measurement of particle height
•No requirement of coded and motorized functions except for the scanning stage and motorization of the focus drive
•Reproducible camera and software settings

 

Leica DMS300 Cleanliness Expert or Leica DMS1000 Cleanliness Expert

Customers need:
• Measurement of particle length and breadth
• Differentiation between reflective and non-reflective particles
• Manual zoom -> Leica DMS300 Cleanliness Expert
• Coded version -> Leica DMS1000 Cleanliness Expert
• Click stop positions

 

Details

 

cleanlinessdm4000Leica DM4000 M LED or Leica DM6000 M

• High optical performance by using objectives with high numerical aperture for the analysis
• ISO conformed detection of particles down to 5 μm
• Height evaluation of particles estimates overall risk potential
• Reproducible illumination, contrast, and camera settings for comparable measurements
• Automatic storage of all relevant system and analysis parameters for each configuration
• Minimal user interaction
• Automatic differentiation between reflective (metallic) and non-reflective (plastic) particles
• Coded/motorized microscope system
• Due to the intelligent store and recall functions, it can also be used for other microscopic applications such as metallography
• Sustainable system with high magnification and low calibration values for future requirements of minimum particle size

 

cleanlinessdm2700Leica DM2700 M

• High optical performance by using objectives with high numerical
aperture for the analysis
• ISO conformed detection of particles down to 5 mm
• Height evaluation of particles to estimate overall risk potential
• Differentiation between reflective (metallic) and non-reflective (plastic) particles
• Automatic storage of magnification and camera settings for each configuration
• Manual microscope system can also be used for metallography or other microscopic applications
• Sustainable system with high magnification and low calibration values for future requirements of minimum article size

 

cleanlinessdms1000Leica DMS300 Cleanliness Expert or Leica DMS1000 Cleanliness Expert

• High optical performance
• ISO conform detection of particles down to 20 mm
• Differentiation between reflective (metallic) and non-reflective (plastic) particles
• Automatic storage of magnification and camera settings for each configuration
• Compact design
• No parallax error as on stereomicroscopes, due to single beam path
• Manual or coded optic carrier

 

What’s important?

Calibration value

The calibration value is expressed by micron per pixel (mm/pixel) and is an essential value that must be presented together with the results of the analysis. It indicates by many pixels display a particle on the screen. The calibration value gives information about the minimum size of a particle that can be detected properly. The smaller the calibration value is the better the resolution of the system and the smaller the particles to be detected can be.

 

cleanlinessimg01The calibration value is calculated according to:

Pixel size of camera chip/total magnification* = calibration value [micron/pixel]

[*= i.e. objective magnification multiplied with C-mount magnification]
Example:  3.2μm/(5 * 0.7) = 0.9μm/pixel

In accordance with ISO-DIS 16232, the length of the smallest particles should be rendered by at least 10 pixels in automated particle measurement.

 

The magnification and the related optical resolution of the used optics is the limiting factor. When a particle cannot be resolved by the optical system it cannot be displayed in its details on the camera chip. The resolving power of an objective is expressed by the numerical aperture (NA). Typical values are given in the following table.

cleanlinessimg02

 

The table shows that a 10x objective with a NA of 0.3 can resolve structures of 0.92 micron where as a zoom based system (NA = 0,075) can resolve structures of 3.67 microns.

Especially in respect to VDA 19 and ISO 16232, the used calibration value should be in adequate proportion to the optical resolution of the microscope system.

 

Example:

  • Objective 5x/0.15NA
  • C-mount 0.7x
  • Digital camera with 3.2μm pixel size

Resolution of the 5x Objective = l/2xNA  →  550nm/(2*0.15) = 1833nm = 1.8μm

⇒ By the 5x Objective with a nA of 0.15 structures in a distance of 1.8μm can be separated.

 

Calibration value = pixel size/total magnification  →  3.2μm/(5 * 0.7) = 0.9μm/pixel

⇒ According to the calibration factor the system displays 0.9μm by one pixel. This means that structures in a distance of 0.9μm can be separated by one pixel.

⇒ Optical resolution is lower than the calibration value!

 

If a particle can not be resolved by the optical system the details can not be displayed on the camera chip! The calibration value is meaning less and provides no information about the quality of the analyses.

By using the camera in binning mode the calibration value gets doubled.

0.9μm/pixel  →  1.8μm/pixel

Now optical resolution (1.8μm) and camera resolution (1,8μm/pixel) are in an adequate proportion to each other and the system is setup in accordance to the VDA 19 and ISO 16232.

 

_Choose_the_right_system_페이지_09

 

 

 

_Choose_the_right_system_페이지_10

다른 제품 보기